Method for manufacturing semiconductor light emitting apparatus by mounting semiconductor light emitting device having stacked dielectric films having different refractive indexes on mounting member

ABSTRACT

A method for manufacturing a semiconductor light emitting apparatus having first semiconductor layer and second semiconductor layer sandwiching a light emitting layer, first and second electrodes provided on respective major surfaces of the first semiconductor and second semiconductor layers to connect thereto, stacked dielectric films having different refractive indexes provided on portions of the major surfaces not covered by the first and second electrodes, and a protruding portion erected on at least a portion of a rim of at least one of the first and second electrodes. The mounting member includes a connection member connected to at least one of the first and second electrodes. The method includes causing the semiconductor light emitting device and a mounting member to face each other, and causing the connection member to contact and join to the at least one of the first and second electrodes using the protruding portion as a guide.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a division of and claims priority under U.S.C. §120from U.S. Ser. No. 13/679,109 filed Nov. 16, 2012, which is a divisionof U.S. Ser. No. 12/549,048 filed Aug. 27, 2009 (now U.S. Pat. No.8,338,844 issued Dec. 25, 2012), and claims the benefit of priorityunder 35 U.S.C. §119 from Japanese Patent Application No. 2008-220144filed Aug. 28, 2008, the entire contents of each of which areincorporated herein by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates to a method for manufacturing a semiconductorlight emitting apparatus and a semiconductor light emitting apparatus.

2. Background Art

In a flip-chip semiconductor light emitting device using a lightemitting layer to produce light and emit the light from a substrateside, light extraction efficiency can be improved by improving thereflectance and increasing the surface area of the reflecting region ofan electrode formation surface.

For example, in the case where a p-side electrode is used to provideboth ohmic characteristics and high-efficiency reflectingcharacteristics, the reflectance of regions in which electrodes are notformed is low, resulting in a lower light extraction efficiency.Therefore, light extraction efficiencies are being improved byincreasing the surface area of the reflecting region by ingenuity suchas shortening the distance between the p-side electrode and an n-sideelectrode.

High mounting precision is necessary during flip-chip mounting of thesemiconductor light emitting device in the case where electrode designemphasizes such light extraction efficiency.

On the other hand, mass production of light emitting diodes usingsemiconductor light emitting devices is necessary to increase costcompetitiveness. Therefore, the time to mount a single device normallymust not be more than 0.5 seconds, and the mounting precision isextremely low.

JP-A 2007-324585 (Kokai) discusses mounting technology using metalsolder for flip-chip mounted semiconductor light emitting devices.

SUMMARY OF THE INVENTION

According to an aspect of the invention, there is provided a method formanufacturing a semiconductor light emitting apparatus, including:causing a semiconductor light emitting device and a mounting member toface each other, the semiconductor light emitting device including: astacked structure unit including a first semiconductor layer, a secondsemiconductor layer, and a light emitting layer provided between thefirst semiconductor layer and the second semiconductor layer; a firstelectrode provided on a major surface of the stacked structure unit toconnect to the first semiconductor layer; a second electrode provided onthe major surface of the stacked structure unit to connect to the secondsemiconductor layer; and a dielectric stacked film provided on the firstsemiconductor layer and the second semiconductor layer of the majorsurface not covered by the first electrode and the second electrode,formed of stacked dielectric films having different refractive indexes,and including a protruding portion erected on at least a portion of arim of at least one of the first and second electrodes, the mountingmember including a connection member connected to at least one of thefirst and second electrodes, and causing the connection member tocontact and join to the at least one of the first and second electrodesusing the protruding portion as a guide.

According to another aspect of the invention, there is provided asemiconductor light emitting apparatus, including: a semiconductor lightemitting device; and a mounting member, the semiconductor light emittingdevice including: a stacked structure unit including a firstsemiconductor layer, a second semiconductor layer, and a light emittinglayer provided between the first semiconductor layer and the secondsemiconductor layer; a first electrode provided on a major surface ofthe stacked structure unit to connect to the first semiconductor layer;a second electrode provided on the major surface of the stackedstructure unit to connect to the second semiconductor layer; and adielectric stacked film provided on the first semiconductor layer andthe second semiconductor layer of the major surface not covered by thefirst electrode and the second electrode, formed of stacked dielectricfilms having different refractive indexes, and including a protrudingportion erected on a rim of at least one of the first and secondelectrodes, and the mounting member being provided to face the majorsurface of the semiconductor light emitting device and including aconnection member, the connection member welded to the at least one ofthe first electrode and the second electrode and covered by a portion ofthe protruding portion.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1A and 1B are sequential schematic cross-sectional viewsillustrating manufacturing processes of a semiconductor light emittingapparatus according to a first embodiment of the invention;

FIGS. 2A and 2B are schematic views illustrating the configuration of asemiconductor light emitting device applicable to the manufacturingprocesses of the semiconductor light emitting apparatus according to thefirst embodiment of the invention;

FIG. 3 is a schematic cross-sectional view illustrating theconfiguration of the semiconductor light emitting apparatus manufacturedby the manufacturing processes of the semiconductor light emittingapparatus according to the first embodiment of the invention;

FIG. 4 is a flowchart illustrating the manufacturing processes of thesemiconductor light emitting apparatus according to the first embodimentof the t invention;

FIGS. 5A to 5C are sequential schematic cross-sectional viewsillustrating manufacturing processes of the semiconductor light emittingdevice applicable to the method for manufacturing the semiconductorlight emitting apparatus according to the first embodiment of theinvention;

FIGS. 6A to 6C are sequential schematic cross-sectional views continuingfrom FIG. 5C;

FIGS. 7A and 7B are graphs illustrating characteristics of thesemiconductor light emitting device for which the method formanufacturing the semiconductor light emitting apparatus according tothe first embodiment of the invention is applicable;

FIG. 8 is a graph illustrating the characteristic of the semiconductorlight emitting device for which the method for manufacturing thesemiconductor light emitting apparatus according to the first embodimentof the invention is applicable;

FIGS. 9A and 9B are schematic cross-sectional views illustrating thestructure of a semiconductor light emitting device of a comparativeexample;

FIG. 10 is a schematic cross-sectional view illustrating theconfiguration of another semiconductor light emitting apparatusmanufactured by the manufacturing processes of the semiconductor lightemitting apparatus according to the first embodiment of the invention;

FIG. 11 is a schematic view illustrating the configuration of anothersemiconductor light emitting device applicable to the manufacturingprocesses of the semiconductor light emitting apparatus according to thefirst embodiment of the invention;

FIGS. 12A to 12C are sequential schematic cross-sectional viewsillustrating manufacturing processes of another semiconductor lightemitting device applicable to the method for manufacturing thesemiconductor light emitting apparatus according to the first embodimentof the invention;

FIGS. 13A to 13C are sequential schematic cross-sectional viewscontinuing from FIG. 12C;

FIG. 14 is a schematic view illustrating the configuration of anothersemiconductor light emitting device applicable to the manufacturingprocesses of the semiconductor light emitting apparatus according to thefirst embodiment of the invention;

FIG. 15 is a schematic view illustrating the configuration of anothersemiconductor light emitting device applicable to the manufacturingprocesses of the semiconductor light emitting apparatus according to thefirst embodiment of the invention;

FIG. 16 is a flowchart illustrating the manufacturing processes of asemiconductor light emitting apparatus according to a second embodimentof the invention;

FIG. 17 is a flowchart illustrating the manufacturing processes of asemiconductor light emitting apparatus according to a third embodimentof the invention;

FIG. 18 is a flowchart illustrating the manufacturing processes of asemiconductor light emitting apparatus according to a fourth embodimentof the invention;

FIG. 19 is a flowchart illustrating the manufacturing processes of asemiconductor light emitting apparatus according to a fifth embodimentof the invention; and

FIG. 20 is a schematic cross-sectional view illustrating the structureof another semiconductor light emitting apparatus manufactured by themethod for manufacturing the semiconductor light emitting apparatusaccording to the embodiments of the invention.

DETAILED DESCRIPTION OF THE INVENTION

Embodiments of the invention will now be described with reference to thedrawings.

The drawings are schematic or conceptual; and the relationships betweenthe thickness and width of portions, the proportional coefficients ofsizes among portions, etc., are not necessarily the same as the actualvalues thereof. Further, the dimensions and proportional coefficientsmay be illustrated differently among drawings, even for identicalportions.

In the specification and drawings, components similar to those describedor illustrated in a drawing thereinabove are marked with like referencenumerals, and a detailed description is omitted as appropriate.

First Embodiment

FIGS. 1A and 1B are sequential schematic cross-sectional viewsillustrating manufacturing processes of a semiconductor light emittingapparatus according to a first embodiment of the invention.

FIGS. 2A and 2B are schematic views illustrating the configuration of asemiconductor light emitting device applicable to the manufacturingprocesses of the semiconductor light emitting apparatus according to thefirst embodiment of the invention.

Namely, FIG. 2B is a plan view, and FIG. 2A is a cross-sectional viewalong line A-A′ of FIG. 2B.

FIG. 3 is a schematic cross-sectional view illustrating theconfiguration of the semiconductor light emitting apparatus manufacturedby the manufacturing processes of the semiconductor light emittingapparatus according to the first embodiment of the invention.

FIG. 4 is a flowchart illustrating the manufacturing processes of thesemiconductor light emitting apparatus according to the first embodimentof the invention.

First, the configuration of a semiconductor light emitting device 101for which the semiconductor light emitting apparatus of this embodimentis applicable will be described with reference to FIGS. 2A and 2B.

In the semiconductor light emitting device 101 according to the firstembodiment of the invention illustrated in FIG. 2A, an n-typesemiconductor layer (first semiconductor layer) 1, a light emittinglayer 3, and a p-type semiconductor layer (second semiconductor layer) 2are stacked in this order to form a stacked structure unit 1 s on asubstrate 10 made of, for example, sapphire.

A p-side electrode (second electrode) 4, an n-side electrode (firstelectrode) 7, and a dielectric stacked film 11 are provided on the samemajor surface 1 a of the stacked structure unit 1 s.

That is, the p-side electrode 4 is provided on the p-type semiconductorlayer 2. As described below, the p-side electrode 4 may include a secondmetal film (second p-side electrode film) 4 b (not illustrated) forminga high-efficiency reflecting film and a first metal film (first p-sideelectrode film) 4 a (not illustrated) made of metal having notnecessarily highly efficient reflecting characteristics.

A portion of the p-type semiconductor layer 2 and the light emittinglayer 3 is removed by, for example, etching. The n-side electrode 7 isprovided on the exposed n-type semiconductor layer 1.

Although the n-side electrode 7 occupies one corner of the squaresemiconductor light emitting device 101 in the specific exampleillustrated in FIG. 2B, the configuration of the n-side electrode 7 isnot limited thereto.

The dielectric stacked film 11 is provided on the n-type semiconductorlayer 1 and the p-type semiconductor layer 2 of the major surface is notcovered by the n-side electrode 7 and the p-side electrode 4. Thedielectric stacked film 11 includes stacked dielectric films havingdifferent refractive indexes. As described below, the dielectric stackedfilm 11 functions as a guide during the assembly when manufacturing asemiconductor light emitting apparatus using the semiconductor lightemitting device 101 in addition to the function of reflecting lightemitted by the light emitting layer 3.

It is sufficient that the dielectric stacked film 11 recited above isprovided on at least a portion of a rim of at least one of the n-sideelectrode 7 and the p-side electrode 4. In other words, the dielectricstacked film 11 may be provided to completely enclose the rim of atleast one of the n-side electrode 7 and the p-side electrode, or thedielectric stacked film 11 may be provided on a portion of the rim of atleast one of the n-side electrode 7 and the p-side electrode 4.

A portion of the dielectric stacked film 11 may be provided on at leasta portion of the n-side electrode 7 and the p-side electrode 4.

The dielectric stacked film 11 is provided in the semiconductor lightemitting device 101. Therefore, a difference in levels from thedielectric stacked film 11 to the n-side electrode 7 and the p-sideelectrode 4 is provided. Restated, the dielectric stacked film 11 in thesemiconductor light emitting device 101 includes protruding portions 11b protruding further than the n-side electrode 7 and the p-sideelectrode 4.

The protruding portions 11 b are erected on at least a portion of therim of at least one of the n-side electrode 7 and the p-side electrode4.

Recesses 11 c are defined by the protruding portions 11 b between theprotruding portions 11 b.

A semiconductor light emitting apparatus including such a semiconductorlight emitting device 101 will now be described with reference to FIG.3. FIG. 3 illustrates the semiconductor light emitting device 101vertically inverted from the illustration of FIG. 2A.

As illustrated in FIG. 3, a semiconductor light emitting apparatus 201manufactured by the method for manufacturing the semiconductor lightemitting apparatus according to this embodiment includes thesemiconductor light emitting device 101 recited above and a mountingmember 13 on which the semiconductor light emitting device 101 may bemounted. The mounting member 13 includes, for example, a submount,mounting substrate, etc., on which the semiconductor light emittingdevice may be mounted.

The mounting member 13 and the semiconductor light emitting device 101are joined by connection members 14 connected to the electrodes (then-side electrode 7 and the p-side electrode 4) of the semiconductorlight emitting device 101. The connection members 14 are conductive andmay include a material which can be welded to metal. For example, amaterial which is conductive, is a solid at room temperature, andchanges to a liquid state at a high temperature, e.g., solder, may beused.

The connection members 14 include an n-side connection member 14 a whichconnects to the n-side electrode 7 of the semiconductor light emittingdevice 101 and a p-side connection member 14 b which connects to thep-side electrode of the semiconductor light emitting device 101. Theconnection members 14 (the n-side connection member 14 a and the p-sideconnection member 14 b) may be provided on not-illustrated electrodesprovided on the mounting member 13. The n-side connection member 14 aand the p-side connection member 14 b protrude further than the majorsurface of the mounting member 13.

Thereby, the semiconductor light emitting device 101 and the mountingmember 13 can be fixed while electrically connecting the not-illustratedelectrodes provided on the mounting member 13 to the electrodes (then-side electrode 7 and the p-side electrode 4) of the semiconductorlight emitting device 101.

In the method for manufacturing the semiconductor light emittingapparatus according to this embodiment that manufactures a semiconductorlight emitting apparatus 201 including such a configuration, thesemiconductor light emitting device 101 and the mounting member 13 arecaused to face each other, and the connection members 14 are caused tocontact and join to the n-side electrode 7 and the p-side electrode 4using the protruding portions 11 b of the dielectric stacked film 11 asguides as illustrated in FIGS. 1A and 1B.

The protruding portions 11 b are provided on at least a portion of therim of at least one of the n-side electrode 7 and the p-side electrode7. Accordingly, in the manufacturing method recited above, theconnection members 14 are caused to contact and join to the n-sideelectrode 7 and the p-side electrode 4 (i.e., the at least one of thesame) having the protruding portions 11 b recited above provided thereonusing the protruding portions 11 b as guides.

The above description will now be described in greater detail.

First, as illustrated in FIG. 1A, for example, the semiconductor lightemitting device 101 is held by a vacuum chuck using a collet, etc.,moved above the mounting member 13, and positioned substantially alignedwith the mounting member 13.

The mounting member 13 and the semiconductor light emitting device 101are caused to contact each other in the substantially aligned state.

In other words, the semiconductor light emitting device 101 and themounting member 13 are brought into contact such that the recess 11 cand the connection member 14 are in a substantially aligned state asillustrated in FIG. 4 (step S110).

At this time, the dielectric stacked film 11 provided in thesemiconductor light emitting device 101 protrudes further than then-side electrode 7 and the p-side electrode 4, and the protrudingportion 11 b of each of the n-side electrode 7 and the p-side electrode4 forms an n-side guide portion 12 a and a p-side guide portion 12 b,respectively. In this design, the n-side guide portion 12 a and thep-side guide portion 12 b are caused to contact and mutually align withthe n-side connection member 14 a and the p-side connection member 14 bof the mounting member 13. The n-side connection member 14 a and thep-side connection member 14 b are inserted and fit into interiors of then-side guide portion 12 a and the p-side guide portion 12 b.

In other words, the planar configurations of the n-side connectionmember 14 a and the p-side connection member 14 b are smaller than theconfigurations of the recesses of the n-side guide portion 12 a and thep-side guide portion 12 b to enter into the interiors of the n-sideguide portion 12 a and the p-side guide portion 12 b, respectively.

In other words, the configurations of the connection members 14 in theplane parallel to the major surface 1 a are smaller than theconfigurations of the recesses 11 c in the plane parallel to the majorsurface 1 a.

The heights of the n-side connection member 14 a and the p-sideconnection member 14 b are set higher than the differences in levels ofthe n-side guide portion 12 a and the p-side guide portion 12 b (thedifference in levels between the n-side guide portion 12 a and then-side electrode 7 and the difference in levels between the p-side guideportion 12 b and the p-side electrode 4), respectively. In other words,the heights of the connection members 14 are higher than the heights(the difference in levels between the n-side guide portion 12 a and then-side electrode 7 and the difference in levels between the p-side guideportion 12 b and the p-side electrode 4) of the protruding portions 11b.

As illustrated in FIG. 1B, vibrations (e.g., ultrasonic vibrations) maybe applied to the semiconductor light emitting device 101 via, forexample, a collet; the semiconductor light emitting device 101 movesaround instantaneously in a range of several tens of microns; the n-sideconnection member 14 a and the p-side connection member 14 b areinserted and fit into the interiors of the n-side guide portion 12 a andthe p-side guide portion 12 b; and the semiconductor light emittingdevice 101 may be fixed in this position. It is sufficient that thevibrations recited above are applied to at least one of thesemiconductor light emitting device 101 and the mounting member 13.Although there is no particular limitation in regard to the frequency ofthe vibrations recited above, ultrasonic vibrations of at least 20 kHzare desirable.

In other words, vibrations are applied to at least one of thesemiconductor light emitting device 101 and the mounting member 13 in acontacting state, the connection members 14 are inserted into therecesses 11 c surrounded by the protruding portions 11 b, and theconnection members 14 are brought into contact with the at least one ofthe n-side electrode 7 and the p-side electrode 7 as illustrated in FIG.4 (step S120).

Thereafter, for example, the temperature is increased to at least themelting point of the connection member 14, and the connection members 14are welded to the p-side electrode 4 and the n-side electrode 7,respectively.

In other words, the connection members 14 are welded to the at least oneof the n-side electrode 7 and the p-side electrode 4 after the fitting(step S130).

Thereby, it is possible to manufacture the semiconductor light emittingapparatus 201 by performing high-precision and high-speed assembly ofthe semiconductor light emitting device 101 having a high lightextraction efficiency and the mounting member 13. Such a manufacturingmethod improves the precision and increases the light extractionefficiency of the semiconductor light emitting apparatus 201.

The heating in step S130 recited above may be performed according to theproperties of the connection members 14. For example, in the case wherethe connection members 14 are solder, the connection members 14 melt dueto the heat and are welded to at least one of the n-side electrode 7 andthe p-side electrode 4.

Step S130 recited above may be implemented according to the propertiesof the connection members 14 and the electrical characteristics and/orreliability required for the semiconductor light emitting apparatus.

In other words, step S130 recited above may be omitted in the case wherethe connection member 14 is electrically connected to at least one ofthe n-side electrode 7 and the p-side electrode 4 with the practicallyrequired contact resistance and reliability after the fitting in stepS120 recited above. Alternatively, step S130 may be omitted in the casewhere, for example, the semiconductor light emitting device 101 and themounting member 13 are housed in an interior of another holder, etc.,and the connection member 14 is electrically connected to at least oneof the n-side electrode 7 and the p-side electrode 4 by a force from theholder with the practically required contact resistance and reliabilityafter step S120.

In the method for manufacturing the semiconductor light emittingapparatus according to this embodiment, the possible range of thealignment of the semiconductor light emitting device 101 can be adjustedby the force from the collet to press (or bring into contact) thesemiconductor light emitting device 101, the frequency and/or strengthof the vibrations, optimization of the material qualities of the colletitself to amplify the vibration amplitude, etc.

According to the method for manufacturing the semiconductor lightemitting apparatus according to this embodiment, it is unnecessary touse gold bumps and the like formed by a ball bonder, and alignment ispossible with high precision. Therefore, the surface area of the n-sideelectrode 7 can be made smaller than those of conventional structures.Thereby, the surface area of the p-side electrode 4 can be increased,the light emitting region and the reflecting region can be increased,and the light output can be increased.

The positioning guides (the n-side guide portion 12 a and the p-sideguide portion 12 b) corresponding to the electrodes (the n-sideelectrode 4 and the p-side electrode 7) can be formed with highprecision on the substrate 10 forming the semiconductor light emittingdevice 101. Therefore, the design degrees of freedom of the electrodescan be improved, the light extraction efficiency can be increased, andimprovement of the light output can be expected.

Further, by forming the dielectric stacked film 11 to cover the ends ofthe p-side electrode 4 and the n-side electrode 7, the connectionmembers (the solder) 14 can be prevented from contacting thesemiconductor layers, and the occurrence of stress and voids between theconnection members (the solder) 14 and the semiconductor layers can beprevented.

Thus, by using the dielectric stacked film 11 of the semiconductor lightemitting device 101, the majority of the major surface of thesemiconductor layers where the electrodes are formed can have areflective structure. Also, by using the dielectric stacked film 11 as apositioning guide, mounting with high alignment precision is easilypossible. Thereby, the degrees of freedom of the electrode designincrease; improvement of the light extraction efficiency due to theincrease of the reflecting region and cost reductions due to high-speedmounting can be expected; and a light source can be provided havinglittle shifting of the light emission points in the semiconductor lightemitting apparatus.

The semiconductor light emitting device 101 applicable to the method formanufacturing the semiconductor light emitting apparatus of thisembodiment will now be described in detail.

First, a specific example of the stacked structure of the semiconductorlayer formed on the substrate 10 will be described.

The semiconductor light emitting device 101 according to this embodimentincludes, for example, a nitride semiconductor formed on the substrate10 made of sapphire.

Namely, for example, metal organic chemical vapor deposition may be usedto form, on the substrate 10 having a surface made of a sapphirec-plane, a sequentially stacked structure including a highcarbon-concentration first AlN buffer layer (having a carbonconcentration of 3×10¹⁸ cm⁻³ to 5×10²⁰ cm⁻³) with a thickness of 3 nm to20 nm, a high-purity second AlN buffer layer (having a carbonconcentration of 1×10¹⁶ cm⁻³ to 3×10¹⁸ cm⁻³) with a thickness of 2 μm, anon-doped GaN buffer layer with a thickness of 3 μm, a Si-doped n-typeGaN contact layer (having a Si concentration of 1×10¹⁸ cm⁻³ to 5×10¹⁸cm⁻³) with a thickness of 4 μm, a Si-doped n-type Al_(0.10)Ga_(0.90)Ncladding layer (having a Si concentration of 1×10¹⁸ cm⁻³) with athickness 0.02 μm, a light emitting layer having a multiple quantum wellstructure of three alternately stacked periods of a Si-doped n-typeAl_(0.11)Ga_(0.89)N barrier layer (having a Si concentration of 1.1 to1.5×10¹⁹ cm⁻³) and a GaInN light emitting layer (having a wavelength of380 nm) with a thickness 0.075 μm, a final Al_(0.11)Ga_(0.89)N barrierlayer of a multiple quantum well (having a Si concentration of 1.1 to1.5×10¹⁹ cm⁻³) with a thickness 0.01 μm, a Si-doped n-typeAl_(0.11)Ga_(0.89)N layer (having a Si concentration of 0.8 to 1.0×10¹⁹cm⁻³) with a thickness of 0.01 μm, a non-doped Al_(0.11)Ga_(0.89)Nspacer layer with a thickness of 0.02 μm, a Mg-doped p-typeAl_(0.28)Ga_(0.72)N cladding layer (having a Mg concentration of 1×10¹⁹cm⁻³) with a thickness of 0.02 μm, a Mg-doped p-type GaN contact layer(having a Mg concentration of 1×10¹⁹ cm⁻³) with a thickness of 0.1 μm,and a high-concentration Mg-doped p-type GaN contact layer (having a Mgconcentration of 2×10²⁰ cm⁻³) with a thickness of 0.02 μm.

Here, the n-type semiconductor layer 1 illustrated in FIG. 2A mayinclude the high carbon-concentration first AlN buffer layer, thehigh-purity second AlN buffer layer, the non-doped GaN buffer layer, theSi-doped n-type GaN contact layer, and the Si-doped n-typeAl_(0.10)Ga_(0.90)N cladding layer recited above.

The light emitting layer 3 illustrated in FIG. 2A may include the finalAl_(0.11)Ga_(0.89)N barrier layer of the multiple quantum well and thelight emitting layer having the multiple quantum well structure formedof three alternately stacked periods of the Si-doped n-typeAl_(0.11)Ga_(0.89)N barrier layer and the GaInN light emitting layer(having a wavelength of 380 nm) recited above.

The p-type semiconductor layer 2 illustrated in FIG. 2A may include theMg-doped p-type Al_(0.28)Ga_(0.72)N cladding layer, the Mg-doped p-typeGaN contact layer, and the high-purity Mg-doped p-type GaN contact layerrecited above.

Increasing the Mg concentration of the Mg-doped p-type GaN contact layerto about 1×10²⁰ cm⁻³ improves the ohmic contact characteristics with thep-side electrode. However, a semiconductor light emitting diode differsfrom a semiconductor laser diode in that there is a risk ofdeterioration of characteristics due to Mg diffusion due to the shortdistance between the contact layer and the light emitting layer 4.Therefore, by utilizing the increased contact surface area between thep-side electrode 4 and the contact layer and the lower current densityduring operation, the Mg concentration can be kept at about 1×10¹⁹ cm⁻³without greatly harming the electrical characteristics. Thereby, Mgdiffusion can be prevented, and light emission characteristics can beimproved.

The high carbon-concentration first AlN buffer layer acts to relieveeffects of crystal types different from the substrate and particularlyreduce screw dislocations.

The surface of the high-purity second AlN buffer layer flattens at theatomic level. Although defects of the non-doped GaN buffer layer grownthereon can be thereby reduced, to this end, it is favorable that thefilm thickness of the high-purity second AlN buffer layer is thickerthan 1 μm. To prevent warp due to strain, it is desirable that thethickness of the high-purity second AlN buffer layer is not greater than4 μm. The high-purity second AlN buffer layer is not limited to AlN,Al_(x)Ga_(1-x)N (0.8≦x≦1) may be used, and the warp of the wafer can becompensated.

The non-doped GaN buffer layer performs the role of reducing defects byperforming three-dimensional island growth on the high-purity second AlNbuffer layer. It is necessary for the average film thickness of thenon-doped GaN buffer layer to be not less than 2 μm to allow flatteningof the growth surface. A total film thickness of the non-doped GaNbuffer layer of 4 to 10 μm is appropriate from the aspect ofreproducibility and reduction of warp.

By utilizing such buffer layers, defects can be reduced to aboutone-tenth of those in conventional low-temperature growth AlN bufferlayers. Such technology enables high-concentration Si doping of then-type GaN contact layer and the manufacture of highly efficientsemiconductor light emitting devices emitting light even in theultraviolet band. Absorption of light in the buffer layers also can besuppressed by reducing the crystal defects of the buffer layers.

The formation of the electrodes on the semiconductor layers of thesemiconductor light emitting device 101 will now be described.

The following description assumes the case where the p-side electrode 4of the semiconductor light emitting device 101 includes a first metalfilm (first p-side electrode film) 4 a made of metal having notnecessarily high-efficiency reflecting characteristics and a secondmetal film (second p-side electrode film) 4 b forming a high-efficiencyreflecting film provided between the first metal film (the first p-sideelectrode film) 4 a and the p-type semiconductor layer 2.

FIGS. 5A to 5C are sequential schematic cross-sectional viewsillustrating manufacturing processes of the semiconductor light emittingdevice applicable to the method for manufacturing the semiconductorlight emitting apparatus according to the first embodiment of theinvention.

FIGS. 6A to 6C are sequential schematic cross-sectional views continuingfrom FIG. 5C.

First, as illustrated in FIG. 5A, dry etching using a mask is performedon a region of a portion of the p-type semiconductor layer 2 to removethe p-type semiconductor layer 2 and the light emitting layer 3 untilthe n-type contact layer is exposed at the surface. At this time, thedifference in levels between the p-type semiconductor layer 2 and then-type semiconductor layer 1 can be patterned into a taperedconfiguration having any angle by optimizing the mask configuration andthe dry etching conditions. Restated, a tapered portion it can beprovided on the semiconductor layers. Here, the angle between the layersurfaces of the semiconductor layers and the inclined face of thetapered portion it is referred to as “taper angle θ (°)” That is, thesmaller the taper angle θ, the more the inclination of the taperedportion it forms a moderate inclined face; and a taper angle θ of 90degrees has a side face in which the stepped region of the n-typesemiconductor layer 1 and the p-type semiconductor layer 2 has astairstep configuration.

The n-side electrode 7 having ohmic characteristics is then formed asillustrated in FIG. 5B. Namely, a not-illustrated patterned lift-offresist is formed on the exposed n-type contact layer, a vacuum vapordeposition apparatus is used to form, for example; a Ti/Al/Ni/Au filmhaving a film thickness of 500 nm as the n-side electrode 7 for theohmic contact region; and after lift-off, sintering is performed at 550°C. in a nitrogen atmosphere.

Continuing as illustrated in FIG. 5C, the p-side electrode 4 is formedby forming a not-illustrated patterned lift-off resist on the p-typecontact layer; using a vacuum vapor deposition apparatus to form, forexample, a Ag film with a film thickness of 200 nm as the second p-sideelectrode film 4 b; and after lift-off, performing sintering at 350° C.in a nitrogen atmosphere.

Then, as illustrated in FIG. 6A, a not-illustrated patterned lift-offresist is formed on the semiconductor layers, and a Pt/Au film, forexample, having a film thickness of 500 nm is formed as the first p-sideelectrode film 4 a on the region in which the Ag film was formed.Thereby, the p-side electrode 4 is formed.

Continuing as illustrated in FIG. 6B, a vacuum vapor depositionapparatus is used to form, for example, five pairs combining a SiO₂ filmand a TiO₂ film for a total of ten layers on the semiconductor layers.

Then, as illustrated in FIG. 6C, a not-illustrated patterned resist isformed thereupon and ammonium fluoride processing is performed to removethe dielectrics recited above to expose the p-side electrode 4 and then-side electrode 7 to form the dielectric stacked film 11. Thedielectrics recited above may be removed by a dry etching process byusing a patterned resist as a mask.

Thus, by forming the dielectric stacked film 11, the dielectric stackedfilm 11 protrudes further than the n-side electrode 7 and the p-sideelectrode 4, and the protruding portions 11 b provided on at least aportion of the rims of each of the n-side electrode 7 and the p-sideelectrode 4 form the n-side guide portion 12 a and the p-side guideportion 12 b.

Continuing, individual light emitting devices are formed by cleavage orcutting by a diamond blade, etc. Thus, the semiconductor light emittingdevice 101 illustrated in FIGS. 2A and 2B is formed.

Thereafter, as described in regard to FIGS. 1A and 1B, the semiconductorlight emitting device 101 is mounted on the mounting member 13 tofabricate the semiconductor light emitting apparatus 201.

The semiconductor light emitting device 101 will now be describedfurther.

As described above, the dielectric stacked film 11 may be formed using,for example, five pairs combining the stacked films of the firstdielectric layer (e.g., SiO₂) and the second dielectric layer (e.g.,TiO₂) as dielectrics having at least two types with different refractiveindexes, that is, a stacked film made of a total of, for example, tenlayers of dielectric layers. In such a case, the film thicknesses ofeach of the first dielectric layer and the second dielectric layer maybe set to a thickness of λ/(4n), where n is the refractive index of eachof the first dielectric layer and the second dielectric layer and λ isthe light emission wavelength of the light emitting layer 3.

In other words, the dielectric stacked film 11 includes multiple firstdielectric layers having a first refractive index alternately stackedwith multiple second dielectric layers having a second refractive indexdifferent from the first refractive index, the thickness of each of thefirst dielectric layers being substantially λ/(4n₁) and the thickness ofeach of the second dielectric layers being substantially λ/(4n₂), wheren₁ is the first refractive index, n₂ is the second refractive index, andA is the light emission wavelength of the light emitting layer 3.

In the dielectric stacked film 11, a higher refractive index ratio ofthe combined dielectrics and a greater number of combined layers (pairs)having different refractive indexes result in a higher reflectance and awider margin with respect to film thickness and/or wavelength.

FIGS. 7A and 7B are graphs illustrating characteristics of thesemiconductor light emitting device to which the method formanufacturing the semiconductor light emitting apparatus according tothe first embodiment of the invention is applicable.

Namely, FIGS. 7A and 7B illustrate simulation results of the reflectanceof light emitted by GaN and perpendicularly incident on the dielectricstacked film 11. FIG. 7A illustrates the dependency of the reflectanceon the refractive index ratio. FIG. 7B illustrates the dependency of thereflectance on the number of pairs. The refractive index ratio of thedielectrics of the dielectric stacked film 11 combining two types isplotted on the horizontal axis of FIG. 7A. The number of pairs of thedielectrics of the dielectric stacked film 11 combining two types isplotted on the horizontal axis of FIG. 7B. The reflectance is plotted onthe vertical axes of FIGS. 7A and 7B.

In these simulations, parameters are changed using the properties of thematerials of the dielectric stacked film 11 of the semiconductor lightemitting device 101 described above.

For both the refractive index ratio and the number of pairs illustratedin FIGS. 7A and 7B, values of the reflectance near 100% can be obtainedby appropriately selecting the conditions.

For example, as illustrated in FIG. 7A, it is desirable to use arefractive index ratio of not less than 1.4 to obtain a reflectance of95% or higher.

As illustrated in FIG. 7B, it is desirable to use a number of pairs ofnot less than 3 to obtain a reflectance of 95% or higher.

The more the angle of the light from the GaN incident on the dielectricstacked film 11 inclines from the perpendicular, the more thereflectance increases. Total reflection is obtained at a thresholdangle.

Selecting design conditions from such properties can provide adielectric stacked film 11 that functions as a reflecting film havingbetter performance than a metal reflecting film. By utilizing such adielectric stacked film 11, improvement of the light extractionefficiency can be expected. The design reflectance of the dielectricstacked film 11 of the semiconductor light emitting device 101 of thisspecific example is 99.7%.

The emitted light incident on the semiconductor layer cross sectionsdisposed on either side of the light emitting layer 3 is affected by thefilm thickness in the direction normal to the dielectric stacked film 11formed on the semiconductor layer cross sections. Therefore, unless thetaper angle is 0°, the light is affected in a direction shifted suchthat the dielectric stacked film 11 is thinner than the design filmthickness. The smaller the taper angle, the more the dielectric stackedfilm of the semiconductor layer cross sections functions as designed.

FIG. 8 is a graph illustrating the characteristic of the semiconductorlight emitting device to which the method for manufacturing thesemiconductor light emitting apparatus according to the first embodimentof the invention is applicable.

Namely, FIG. 8 illustrates the calculation results of the relationshipbetween the taper angle and the reflectance of the dielectric stackedfilm 11. The taper angle is plotted on the horizontal axis, and thereflectance of the dielectric stacked film 11 is plotted on the verticalaxis. FIG. 8 illustrates the calculation results using the designconditions described above in regard to the semiconductor light emittingdevice 101.

As illustrated in FIG. 8, although high reflecting characteristics areobtained in the case where the taper angle θ is about 40 degrees orsmaller, the film thickness of the dielectric stacked film 11 is toothin when the taper angle θ is larger than 40 degrees. Therefore, thehigh reflecting characteristics are not obtained as designed.

The margin for high reflecting characteristics with respect to the taperangle is wider for a larger refractive index ratio of the two types ofstacked dielectrics.

Providing the tapered portion it can prevent separation of thedielectric stacked film 11 due to the different levels of thesemiconductor layer cross sections disposed on either side of the lightemitting layer 3. The tapered portion it functions as a region thatchanges the angle of emitted light repeatedly reflected inside thesemiconductor layers without being extracted. Therefore, the extractionefficiency is improved.

The taper angle θ of the tapered portion it may be appropriatelyestablished based on the device surface area and light emissioncharacteristics of the semiconductor light emitting device, thepatterning precision, and the like.

The dielectric stacked film 11 may include an oxide, nitride,oxynitride, or the like including at least one of silicon (Si), aluminum(Al), zirconium (Zr), titanium (Ti), niobium (Nb), tantalum (Ta),magnesium (Mg), hafnium (Hf), cerium (Ce), zinc (Zn), or the like. It isfavorable that the total film thickness of the stacked dielectric filmsis not less than 50 nm to ensure insulative properties and not more than1,000 nm to suppress cracks in the dielectric films.

Increasing the film thickness of the dielectric stacked film 11 as muchas possible improves the performance as a positioning guide. Therefore,it is more favorable that the film thickness of the dielectric stackedfilm 11 is 1,000 nm to 10,000 nm.

To reduce stress between different types of materials due to heatreleased during device operation, it is favorable that the first layerof the dielectric stacked film 11 on the semiconductor layer side is amaterial having a linear coefficient of thermal expansion near to thoseof the semiconductor layers. For example, in the case where thesemiconductor layers are GaN, it is favorable to use, for example, SiNas the first layer of the dielectric stacked film 11 on thesemiconductor layer side.

Even when the total film thickness of the dielectric stacked film 11 isincreased, stacking different types of dielectrics can relieve thestress in the interior. Therefore, compared to a single layer, damagesuch as cracks do not occur easily; stress on the semiconductor layerscan also be relieved; and therefore the performance as the positioningguide improves and the reliability also improves.

In particular, stacking dielectrics under tensile stress and compressivestress promotes stress-relieving effects.

The dielectric stacked film 11 forming the positioning guides isprovided around the connection members 14 and therefore can preventexcessive spreading of the connection members (the solder) during theheating of the mounting process. Thereby, the design degrees of freedomof the surface area, film thickness, etc., of the connection members(the solder) 14 increase; the degrees of freedom of the wettability withrespect to the electrodes increase; and rapid mounting is possible.

The semiconductor light emitting device to which the method formanufacturing the semiconductor light emitting apparatus of thisembodiment is applicable is made of at least the semiconductor layersincluding the n-type semiconductor layer, the p-type semiconductorlayer, and the light emitting layer disposed therebetween. Although thematerials of the semiconductor layers are not particularly limited, agallium nitride compound semiconductor such as, for example,Al_(x)Ga_(1-x-y)In_(y)N (x≧0, y≧0, and x+y≦1) may be used. Although themethods for forming such semiconductor layers are not particularlylimited, technology such as, for example, metal organic chemical vapordeposition, molecular beam epitaxy, and the like may be used.

Although the substrate material of the semiconductor light emittingdevice to which the method for manufacturing the semiconductor lightemitting apparatus of this embodiment is applicable is not particularlylimited, general substrates such as sapphire, SiC, GaN, GaAs, and Si maybe used. The substrate may ultimately be removed.

As described above, the p-side electrode 4 may be formed of the secondp-side electrode film 4 b including at least silver or silver alloy andthe first p-side electrode film 4 a made of metal not including at leastsilver or silver alloy. The material of the second p-side electrode film4 b may be a single layer of silver, or may be an alloy layer includingmetal other than silver and aluminum.

Although there is a trend for the reflection efficiencies of normalmetal single-layer films in the visible light band to decline as thewavelengths become shorter in the ultraviolet band of 400 nm and below,silver has high reflecting efficiency characteristics for light in theultraviolet band of 370 nm to 400 nm. Therefore, in the case of asemiconductor light emitting device emitting ultraviolet light includinga second p-side electrode film 4 b of silver or silver alloy, it isdesirable that the component ratio of silver of the second p-sideelectrode film 4 b on the semiconductor interface side is high. It isfavorable that the film thickness of the second p-side electrode film 4b is not less than 100 nm to ensure the light reflection efficiency.

In the case where silver or silver alloy is used in the second p-sideelectrode film 4 b, the risk of insulation defects and breakdown voltagedefects due to migration from the silver or the silver alloy decreasesas the distance between the second p-side electrode film 4 b and then-side electrode 7 increases. The light extraction efficiency increasesas the p-side electrode 4 facing the n-side electrode 7 proximal to thecenter of the device is formed up to the end of the p-type contact layeras much as the process conditions such as lithography precision permit.When considering the current path from the second p-side electrode film4 b to the n-side electrode 7, there is a trend for the current toconcentrate in the region having the shortest distance between thesecond p-side electrode film 4 b and the n-side electrode 7. Therefore,it is favorable to design the region having the shortest distancebetween the second p-side electrode film 4 b and the n-side electrode 7facing each other to be as long as possible to relieve the electricfield concentration.

When viewed as a plane, the longer the length of the region where thesecond p-side electrode film 4 b and the n-side electrode 7 face eachother, the longer the current path from the second p-side electrode film4 b to the n-side electrode 7. Therefore, the electric fieldconcentration is relieved and deterioration of the second p-sideelectrode film 4 b is suppressed. The surface area and configuration ofthe second p-side electrode film 4 b and the distance between the secondp-side electrode film 4 b and the n-side electrode 7 may beappropriately decided considering such effects.

The first p-side electrode film 4 a is formed of metal not includingsilver and electrically contacts the second p-side electrode film 4 b.The material of the first p-side electrode film 4 a is not particularlylimited and may include a single-layer or multi-layer metal film, ametal alloy layer, a single-layer or multi-layer conductive oxide film,or a combination thereof. The film thickness of the first p-sideelectrode film 4 a is not particularly limited, and may be selected, forexample, between 100 nm to 1,000 nm.

The material of the n-side electrode 7 is not particularly limited. Aconductive single-layer or multi-layer film providing an ohmic electrodefor an n-type semiconductor may be used. The film thickness of then-side electrode 7 is not particularly limited, and may be between 5 nmand 1,000 nm.

Other pads may be provided on the p-side electrode 4 and the n-sideelectrode 7. The film thickness of the pads is not particularly limited,and may be, for example, between 1,000 nm and 10,000 nm. Forming thepads can improve wettability during welding with the connection members(e.g., the solder) 14 and reduce the risk of excessive alloyingreactions between the electrodes and the connection members (e.g., thesolder) 14.

Using a crystal on a monocrystalline AlN buffer layer can reduce crystaldefects to realize high luminous efficiency even in wavelength bandsshorter than 400 nm where efficiency normally declines.

In the case where an amorphous or polycrystalline AlN layer is providedto relieve differences in crystal types on the sapphire substrate, thebuffer layer itself forms a light absorbing body. Therefore, the lightextraction efficiency of the light emitting device declines undesirably.Conversely, by forming the n-type semiconductor layer 1, the lightemitting layer 3, and the p-type semiconductor layer 2 on the substrate10 made of sapphire via the high carbon concentration monocrystallineAlN buffer layer and the high-purity monocrystalline AlN buffer layer,the buffer layers do not easily form light absorbing bodies, and crystaldefects can be drastically reduced. Thereby, the light absorbing bodiesin the crystal can be drastically reduced. In such a case, it ispossible for the emitted light to repeatedly be reflected many timesinside the crystal, resulting in better effects from increasing thereflecting region of the electrode formation surface. Due to sucheffects, improvement of the light emission intensity can be expected.

FIGS. 9A and 9B are schematic cross-sectional views illustrating thestructure of a semiconductor light emitting device of a comparativeexample.

The dielectric stacked film 11 is not provided in a semiconductor lightemitting device 90 of the comparative example illustrated in FIGS. 9Aand 9B. In other words, SiO₂ of 400 nm, for example, is formed as anot-illustrated single layer dielectric film instead of the dielectricstacked film 11. Therefore, no differences in levels to the n-sideelectrode 7 and to the p-side electrode 4 are provided, and noprotruding portions forming guide portions are provided.

The electrodes of the semiconductor light emitting device 90 having sucha configuration are formed as follows.

First, to form the n-side electrode 7, a patterned lift-off resist isformed on the exposed n-type contact layer; a vacuum vapor depositionapparatus is used to form the n-side electrode 7 having a film thicknessof 500 nm made of, for example, Ti/Al/Ni/Au as an ohmic contact region;and sintering is performed at 550° C. in a nitrogen atmosphere.

To form the p-side electrode 4, a patterned lift-off resist is formed onthe semiconductor layers; a vacuum vapor deposition apparatus is used toform a Ag film having a film thickness of 200 nm as the second p-sideelectrode film 4 b on the p-type contact layer; and after lift-off,sintering is performed at 350° C. in a nitrogen atmosphere. A similarlypatterned lift-off resist is formed on the semiconductor layers, and aPt/Au film having a film thickness of 500 nm of the first p-sideelectrode film 4 a is formed to cover the region in which the Ag film ofthe second p-side electrode film 4 b is formed.

Continuing, individual light emitting devices are formed by cleavage orcutting by a diamond blade, etc. Thus, the semiconductor light emittingdevice 90 of the comparative example is fabricated.

The method for mounting the semiconductor light emitting device 90having such a configuration on the mounting member 13 is describedbelow.

First, a process that mounts the semiconductor light emitting device 90on the mounting member 13 uses a collet or the like to move thesemiconductor light emitting device 90 above the mounting member 13.After aligning the connection members (the solder) 14 on the mountingmember 13 with the electrodes, the semiconductor light emitting device90 is pressed onto the mounting member 13. Then, the temperature of themounting member is increased to at least the melting point of theconnection members (the solder) 14, and the connection members (thesolder) 14 are welded to the p-side electrode 4 and the n-side electrode7, respectively.

In this comparative example, the relative positions of the semiconductorlight emitting device 90 and the mounting member 13 are determined bythe alignment precision of, for example, a motor that moves the collet.Therefore, the mounting precision is poor. Also, in the case where thespeed of moving the device is increased to increase the takt time, themounting precision gets worse further. To accommodate the poor mountingprecision, it is necessary to improve the alignment margin by making theelectrodes of the semiconductor light emitting device 90 mutuallydistal, enlarging the surface area of the n-side electrode 7, etc. As aresult, the degrees of freedom of the electrode design decrease, and itis not always possible to select the optimal electrode structure inregard to the light extraction efficiency and the light output.

Conversely, according to this embodiment, the dielectric stacked film 11is utilized as a positioning guide to easily provide a high mountingprecision. Therefore, the degrees of freedom of the electrode designincrease. Simultaneously, the dielectric stacked film 11 can be used asa high-efficiency reflecting film. Due to such effects, the lightextraction efficiency and the light output can be improved.

Thus, the method for manufacturing the semiconductor light emittingapparatus according to this embodiment can perform high-precision andhigh-speed assembly of a semiconductor light emitting apparatus havinghigh light extraction efficiency.

FIG. 10 is a schematic cross-sectional view illustrating theconfiguration of another semiconductor light emitting apparatusmanufactured by the manufacturing processes of the semiconductor lightemitting apparatus according to the first embodiment of the invention.

In a semiconductor light emitting apparatus 202 illustrated in FIG. 10,the connection members 14 (the n-side connection member 14 a and thep-side connection member 14 b) cover a portion of the dielectric stackedfilm 11.

In other words, the semiconductor light emitting apparatus 202 accordingto this embodiment includes the semiconductor light emitting device 101including the stacked structure unit is including the n-typesemiconductor layer (first semiconductor layer) 1, the p-typesemiconductor layer (second semiconductor layer) 2, and the lightemitting layer 3 provided between the first semiconductor layer and thesecond semiconductor layer, the n-side electrode (first electrode) 7provided on the major surface 1 a of the stacked structure unit is toconnect to the first semiconductor layer, the p-side electrode (secondelectrode) 4 provided on the major surface 1 a of the stacked structureunit 1 s to connect to the second semiconductor layer 2, and thedielectric stacked film 11 provided on the first semiconductor layer andthe second semiconductor layer of the major surface 1 a not covered bythe first electrode and the second electrode, formed of multiple stackeddielectric films having different refractive indexes, and including theprotruding portion 11 b erected on at least a portion of a rim of atleast one of the first and second electrodes; and the mounting member 13provided to face the major surface 1 a of the semiconductor lightemitting device 101 and including the connection member 14, theconnection member 14 welded to the at least one of the first electrodeand the second electrode and covering a portion of the protrudingportion 11 b.

Thus, the connection member 14 (e.g., solder), as shown in FIG. 10,covers a portion of the protruding portion 11 b of the dielectricstacked film 11 and thereby prevents, for example, moisture and the likefrom entering from the interface between the dielectric stacked film 11and the connection member 14, reaching the n-side electrode 7 and/or thep-side electrode 4, and causing deterioration of the electrodes.

To manufacture the semiconductor light emitting apparatus 202, thewelding step S130 of the method for manufacturing the semiconductorlight emitting apparatus according to this embodiment illustrated inFIG. 4 includes covering a portion of the protruding portion 11 b of thedielectric stacked film 11 with the connection member 14.

At this time, it is necessary that the connection member 14 fixes thesemiconductor light emitting device 101 and the mounting member 13 usinga pattern having high precision to prevent electrical shorts between then-side electrode 7 and the p-side electrode 4.

As in the method for manufacturing the semiconductor light emittingapparatus according to this embodiment, the semiconductor light emittingdevice 101 and the mounting member 13 are assembled by using theprotruding portion 11 b formed of the dielectric stacked film 11 as aguide, that is, fitting the connection member 14 into the recess 11 cdefined by the protruding portion 11 b. The assembly precision isthereby increased. Therefore, the precision of the configuration of theconnection member 14 is high after assembling and fixing thesemiconductor light emitting device 101 and the mounting member 13.Thereby, the connection member 14 can cover a portion of the dielectricstacked film 11 with high precision.

In other words, the low assembly precision of the comparative example inwhich the dielectric stacked film 11 is not provided unfortunatelyresults in electrical shorts between the n-side electrode 7 and thep-side electrode 4 in the case of an excessive amount of the connectionmember 14. In the case of a scant amount of the connection member 14,deterioration of the electrodes cannot be prevented.

Further, in the manufacturing method of the comparative example in whichthe dielectric stacked film 11 is provided but not used as a guideduring assembly, the assembly precision is low. Therefore, in the caseof an excessive amount of the connection member 14, the connectionmember 14 flows and is disposed on portions on the dielectric stackedfilm 11 other than the regions to be covered, unfortunately resulting inelectrical shorts between the n-side electrode 7 and the p-sideelectrode 4. On the other hand, in the case of a scant amount of theconnection member 14, the connection member 14 cannot cover theprescribed region of the dielectric stacked film 11, and the effect ofpreventing the deterioration of the electrodes described above cannot beobtained. Furthermore, in the case where the precision is low and theamount of the connection member 14 is small, the connection member 14cannot be sufficiently filled into the interior of the recess 11 cdefined by the dielectric stacked film 11, a gap occurs, thedeterioration of the electrodes cannot be prevented, and the reliabilityis poor.

Conversely, according to the method for manufacturing the semiconductorlight emitting apparatus according to this embodiment as describedabove, the dielectric stacked film 11 is used as a positioning guideduring assembly. Therefore, the precision is high, and the connectionmember 14 can cover a portion of the dielectric stacked film 11 fromabove to provide the prescribed configuration and good precision.Thereby, a semiconductor light emitting apparatus having highreliability can be realized. In the semiconductor light emittingapparatus 202 according to this embodiment, the connection member 14covers a portion of the dielectric stacked film 11 from above with theprescribed configuration and good precision. Therefore, the reliabilityis high.

FIG. 11 is a schematic view illustrating the configuration of anothersemiconductor light emitting device applicable to the manufacturingprocesses of the semiconductor light emitting apparatus according to thefirst embodiment of the invention.

FIGS. 12A to 12C are sequential schematic cross-sectional viewsillustrating manufacturing processes of another semiconductor lightemitting device applicable to the method for manufacturing thesemiconductor light emitting apparatus according to the first embodimentof the invention.

FIGS. 13A to 13C are sequential schematic cross-sectional viewscontinuing from FIG. 12C.

In another semiconductor light emitting device 102 applicable to themethod for manufacturing the semiconductor light emitting apparatusaccording to this embodiment illustrated in FIG. 11, a dielectric film11 a is provided between the dielectric stacked film 11 and the n-typesemiconductor layer 1 and between the dielectric stacked film 11 and thep-type semiconductor layer 2. The dielectric film 11 a has a betterability than the dielectric stacked film 11 to cover differences inlevels. Thereby, even in the case where the semiconductor layer crosssections disposed on either side of the light emitting layer 3 areperpendicular (have a taper angle θ of 90°), the cross section thereofcan be covered well by the dielectric film 11 a. Otherwise, thesemiconductor light emitting device 102 is similar to the semiconductorlight emitting device 101 described above, and a description is omitted.

Although details are omitted in FIG. 11, the p-side electrode 4 includesthe first p-side electrode film 4 a and the second p-side electrode film4 b provided between the first p-side electrode film 4 a and the p-typesemiconductor layer 2.

Such a semiconductor light emitting device 102 is fabricated as follows.

First, as illustrated in FIG. 12A, dry etching using a mask is performedon a region of a portion of the p-type semiconductor layer 2 to removethe p-type semiconductor layer 2 and the light emitting layer 3 untilthe n-type contact layer is exposed at the surface.

Then, as illustrated in FIG. 12B, SiO₂ forming the dielectric film 11 ahaving a film thickness of 200 nm is formed on the semiconductor layersusing a thermal CVD apparatus. By using the thermal CVD apparatus, afilm having a good ability to cover steps can be formed, the ability tocover perpendicular cross sections is good, and the dielectric film 11 acan be formed.

Continuing as illustrated in FIG. 12C, the n-side electrode 7 havingohmic characteristics is formed. Namely, a not-illustrated patternedlift-off resist is formed on the semiconductor layers and a portion ofthe SiO₂ film on the exposed n-type contact layer is removed by ammoniumfluoride processing. The SiO₂ film is removed and a vacuum vapordeposition apparatus is used to form the n-side electrode 7 made of, forexample, a Ti/Al/Ni/Au film having a film thickness of 500 nm as anohmic contact region on the exposed n-type contact layer, and sinteringis performed at 550° C. in a nitrogen atmosphere.

Then, to form the p-side electrode 4 illustrated in FIG. 13A, anot-illustrated patterned lift-off resist is formed on the semiconductorlayers and a portion of the SiO₂ film on the p-type contact layer isremoved by ammonium fluoride processing. A patterned lift-off resist isthen formed on the p-type contact layer; a vacuum vapor depositionapparatus is used to form a Ag film, for example, with a film thicknessof 200 nm as the second p-side electrode film 4 b; and after lift-off,sintering is performed at 350° C. in a nitrogen atmosphere.

Then, as illustrated in FIG. 13B, a patterned lift-off resist is formedon the semiconductor layers, a Pt/Au film, for example, is formed with afilm thickness of 500 nm as the first p-side electrode film 4 a in theregion in which the Ag film is formed, and the p-side electrode 4 isformed.

Continuing, a not-illustrated patterned lift-off resist is formed on thesemiconductor layers, a vacuum vapor deposition apparatus is used toform, for example, five pairs combining a SiO₂ film and a TiO₂ film fora total of ten layers on the semiconductor layers, and the dielectricstacked film 11 is formed by lift-off. Each of the film thicknesses areλ/(4n), where n is the refractive index of each film and A is the lightemission wavelength of the light emitting layer 3.

Thus, by forming the dielectric stacked film 11, the p-side guideportion 12 b for the p-side electrode 4 and the p-side guide portion 12a for the n-side electrode 7 can be formed to be used during mounting.

Thus, in the semiconductor light emitting device 102, the dielectricfilm 11 a formed by, for example, thermal CVD has a better ability thanthe dielectric stacked film 11 to cover differences in levels andtherefore can be formed to cover even steep differences in levels of thesemiconductor layer cross sections disposed on either side of the lightemitting layer 3. Therefore, it is unnecessary to pattern thedifferences in levels of the semiconductor layer cross sections disposedon either side of the light emitting layer 3 into a taperedconfiguration, and simpler and fewer semiconductor layer patterningprocesses can be used.

Further, by protecting the p-type contact layer and the n-type contactlayer from above by the dielectric film 11 a prior to forming the n-sideelectrode 7 and the p-side electrode 4, contamination adhering at theinterface between the electrodes and the semiconductor layers during theelectrode formation steps can be drastically reduced. Therefore, thereliability, yield, electrical characteristics, and light emissioncharacteristics can be improved.

Forming the dielectric film 11 a results in almost no effects on thereflectance of the dielectric stacked film 11 and the dielectric film 11a. Using multiple stacked pairs of dielectrics having differentrefractive indexes for the dielectric stacked film 11 can provide asufficiently high design reflectance. In the semiconductor lightemitting device 102 of this specific example, the design reflectance ofthe region in which the dielectric film 11 a and the dielectric stackedfilm 11 are stacked together is 99.5%.

FIG. 14 is a schematic view illustrating the configuration of anothersemiconductor light emitting device applicable to the manufacturingprocesses of the semiconductor light emitting apparatus according to thefirst embodiment of the invention.

In another semiconductor light emitting device 103 applicable to themethod for manufacturing the semiconductor light emitting apparatusaccording to this embodiment illustrated in FIG. 14, the p-sideelectrode 4 includes the first p-side electrode film 4 a and the secondp-side electrode film 4 b provided between the first p-side electrodefilm 4 a and the p-type semiconductor layer 2, and further includes athird p-side electrode film 4 c provided between the first p-sideelectrode film 4 a and the second p-side electrode film 4 b. Otherwise,the semiconductor light emitting device 103 is similar to thesemiconductor light emitting device 101 described above, and adescription is omitted.

The third p-side electrode film 4 c functions to prevent the materialsincluded in the first p-side electrode film 4 a, the solder of theconnection member 14 during mounting, and the like from diffusing intothe second p-side electrode film 4 b, and prevent the materials includedin the first p-side electrode film 4 a and/or the connection members 14from reacting with the materials included in the second p-side electrodefilm 4 b. The third p-side electrode film 4 c electrically connects tothe first p-side electrode film 4 a and the second p-side electrode film4 b.

The third p-side electrode film 4 c may include a material that does notreact with silver or does not actively diffuse into silver.

Materials which may be used as the third p-side electrode film 4 cinclude single-layer films or stacked films of a high melting-pointmetal usable as the diffusion prevention layer such as, for example,vanadium (V), chrome (Cr), iron (Fe), cobalt (Co), nickel (Ni), niobium(Nb), molybdenum (Mo), ruthenium (Ru), rhodium (Rh), tantalum (Ta),tungsten (W), rhenium (Re), osmium (Os), iridium (Ir), and platinum(Pt).

More favorable metals that have a high work function and easily provideohmic contact with the p-GaN contact layer to prevent problems even inthe case where some diffusion into the second p-side electrode film 4 boccurs include iron (Fe), cobalt (Co), nickel (Ni), rhodium (Rh),tungsten (W), rhenium (Re), osmium (Os), iridium (Ir), and platinum(Pt).

In the case where the third p-side electrode film 4 c is a single-layerfilm, it is favorable that the film thickness thereof is in the range of5 nm to 200 nm to maintain the film state. The film thickness for astacked film is not particularly limited, and may be, for example,between 10 nm and 10,000 nm.

By providing the third p-side electrode film 4 c as a diffusionprevention layer, mounting is possible at higher temperatures.Therefore, the mounting rate can be increased to improve costcompetitiveness.

The dielectric film 11 a described in regard to the semiconductor lightemitting device 102 may be provided in the semiconductor light emittingdevice 103.

FIG. 15 is a schematic view illustrating the configuration of anothersemiconductor light emitting device applicable to the manufacturingprocesses of the semiconductor light emitting apparatus according to thefirst embodiment of the invention.

In another semiconductor light emitting device 104 applicable to themethod for manufacturing the semiconductor light emitting apparatusaccording to this embodiment illustrated in FIG. 15, conductive guidefilms 12 m are provided on the p-side electrode 4 and the n-sideelectrode 7 not covered by the dielectric stacked film 11, the upperface (on the side of the dielectric stacked film 11 opposite thesemiconductor layers) of the dielectric stacked film 11 of theperipheral portions of the p-side electrode 4 and the n-side electrode7, and on the side faces of the dielectric stacked film 11. Otherwise,the semiconductor light emitting device 104 is similar to thesemiconductor light emitting device 101 described above, and adescription is omitted.

The n-side guide portion 12 a is formed of the dielectric stacked film11 and the conductive guide film 12 m at the peripheral portion of then-side electrode 7. The p-side guide portion 12 b is formed of thedielectric stacked film 11 and the conductive guide film 12 m at theperipheral portion of the p-side electrode 4. In other words, theconductive guide films 12 m provided on the side faces of the dielectricstacked film 11 define the recesses 11 c, and the connection members 14fit into the recesses 11 c to assemble the semiconductor light emittingdevice 104 and the mounting member 13.

Thus, even in the case where the conductive guide films 12 m areprovided on portions of the protruding portions of the dielectricstacked film 11, the connection members 14 can be brought into contactand joined with the at least one of the n-side electrode 7 and thep-side electrode 4 using the protruding portions 11 b of the dielectricstacked film 11 as guides.

The conductive guide films 12 m may be formed by, for example, forming apatterned lift-off resist on the semiconductor layers after forming thedielectric stacked film 11 and forming, for example, a Ti/Pt/Au filmwith a film thickness of 500 nm as the conductive guide films 12 m.

By providing the conductive guide films 12 m in the n-side guide portion12 a and the p-side guide portion 12 b to cover a portion of the upperface and the side faces of the dielectric stacked film 11, damage of theguide portions due to shocks during contact of the connection members 14(e.g., the solder) with the n-side guide portion 12 a and the p-sideguide portion 12 b or applied vibrations can be prevented duringmounting. In the case of using solder for the connection member 14, thewettability against the solder is improved by providing the conductiveguide films 12 m as the effective bonding surface area with the solderis increased. Thereby, easiness of mounting process is improved and themounting speed can be further improved, then a cost competitive edge canbe further improved.

It is favorable that the cross section of the dielectric stacked film 11has a tapered configuration for easy formation of the conductive guidefilms 12 m on the side faces of the dielectric stacked film 11.

By protecting the dielectric stacked film 11 forming the n-side guideportion 12 a and the p-side guide portion 12 b by the conductive guidefilms 12 m, vibrations under more vigorous conditions can be used, andthe semiconductor light emitting device 104 can be moved in a widerrange. Therefore, the mounting rate can be increased more to furtherimprove cost competitiveness.

Second Embodiment

FIG. 16 is a flowchart illustrating the manufacturing processes of asemiconductor light emitting apparatus according to a second embodimentof the invention.

As illustrated in FIG. 16, the method for manufacturing thesemiconductor light emitting apparatus according to the secondembodiment of the invention further includes the following processesprior to step S110 illustrated in FIG. 4.

Namely, first, the first semiconductor layer (the n-type semiconductorlayer 1), the light emitting layer 3, and the second semiconductor layer(the p-type semiconductor layer 2) are stacked on the substrate 10 (stepS210).

Then, a portion of the second semiconductor layer and the light emittinglayer is removed to expose the first semiconductor layer (step S220).

The first electrode (the n-side electrode 7) is then formed on theexposed first semiconductor layer (step S230).

The second electrode (the p-side electrode 4) is then formed on thesecond semiconductor layer (step S240).

Multiple types of dielectric films having different refractive indexesare alternately stacked on the exposed first semiconductor layer and thesecond semiconductor layer not covered by the first electrode and thesecond electrode to form the dielectric stacked film 11 (step S250).

The methods described in regard to FIGS. 5A to 6C, for example, may beused in step S210 to step S250 recited above.

Thus, according to the method for manufacturing the semiconductor lightemitting apparatus according to this embodiment, the dielectric stackedfilm 11 forming the guide portions is formed; the semiconductor lightemitting device and the mounting member 13 can be assembled utilizingthe guide portions; high-precision and high-speed assembly is possible;and a semiconductor light emitting apparatus having high lightextraction efficiency can be provided.

Steps S210 to S250 recited above are interchangeable within the extentof technical feasibility and may be implemented simultaneously. Forexample, steps S230 and S240 which form the n-side electrode 7 and thep-side electrode 4 are interchangeable and may be implementedsimultaneously.

Third Embodiment

FIG. 17 is a flowchart illustrating the manufacturing processes of asemiconductor light emitting apparatus according to a third embodimentof the invention.

As illustrated in FIG. 17, the method for manufacturing thesemiconductor light emitting apparatus according to the third embodimentof the invention further includes the following processes prior to stepS110 illustrated in FIG. 4.

Namely, the first semiconductor layer (the n-type semiconductor layer1), the light emitting layer 3, and the second semiconductor layer (thep-type semiconductor layer 2) are stacked on the substrate 10 (stepS310).

Then, a portion of the second semiconductor layer and a portion of thelight emitting layer are removed to expose the first semiconductor layer(step S320).

Dielectric films having different refractive indexes are thenalternately stacked on a portion of the exposed first semiconductorlayer and a portion of the second semiconductor layer to form thedielectric stacked film 11 (step S330).

The first electrode (the n-side electrode 7) is then formed on the firstsemiconductor layer not covered by the dielectric stacked film 11 (stepS340).

The second electrode (the p-side electrode 4) is then formed on thesecond semiconductor layer not covered by the dielectric stacked film 11(step S350).

The methods described in regard to FIGS. 5A to 6C, for example, may bemodified and used in step S310 to step S350 recited above.

Fourth Embodiment

FIG. 18 is a flowchart illustrating the manufacturing processes of asemiconductor light emitting apparatus according to a fourth embodimentof the invention.

As illustrated in FIG. 18, the dielectric film 11 a described above isprovided in the method for manufacturing the semiconductor lightemitting apparatus according to the fourth embodiment of the inventionafter exposing the first semiconductor layer and prior to forming thedielectric stacked film 11.

Namely, as illustrated in FIG. 18, the dielectric film 11 a, having abetter ability than the dielectric stacked film 11 to cover the firstsemiconductor layer and the second semiconductor layer, is formed on aportion of the uncovered first semiconductor layer and a portion of thesecond semiconductor layer (step S225) between the process that exposesthe first semiconductor layer (step S220) and the process that forms thedielectric stacked film (step S250).

In this specific example, step S225 is implemented between the processthat exposes the first semiconductor layer (step S220) and the processthat forms the first electrode (step S230). In such a case, the order ofstep S230 to step S250 is interchangeable, and the processes can beimplemented simultaneously.

The methods described in regard to FIG. 12A to FIG. 13C, for example,may be used in step S210 to step S250 recited above.

Fifth Embodiment

FIG. 19 is a flowchart illustrating the manufacturing processes of asemiconductor light emitting apparatus according to a fifth embodimentof the invention.

As illustrated in FIG. 19, the dielectric film 11 a described above isprovided by the method for manufacturing the semiconductor lightemitting apparatus according to the fifth embodiment of the inventionafter exposing the first semiconductor layer and prior to forming thedielectric stacked film 11.

Namely, as illustrated in FIG. 19, the dielectric film 11 a, having abetter ability than the dielectric stacked film 11 to cover the firstsemiconductor layer and the second semiconductor layer, is formed on aportion of the exposed first semiconductor layer and a portion of thesecond semiconductor layer (step S325) between the process that exposesthe first semiconductor layer (step S320) and the process that forms thedielectric stacked film (step S330).

The order of step S330 to step S350 recited above is interchangeable,and the processes may be implemented simultaneously.

In the methods for manufacturing the semiconductor light emittingapparatus according to the third to fifth embodiments recited above, thedielectric stacked film 11 including the protruding portions 11 bforming the guide portions are formed; the semiconductor light emittingdevice and the mounting member 13 can be assembled utilizing the guideportions; high-precision and high-speed assembly is possible; and asemiconductor light emitting apparatus having high light extractionefficiency can be provided.

In the method for manufacturing the semiconductor light emittingapparatus according to the second to fifth embodiments recited above,the process that exposes the first semiconductor layer (step S220 orstep S320) may include forming the tapered portion it on the stackedstructure unit 1 s to incline with respect to the layer surface of thestacked structure unit 1 s. Thereby, the covering of the dielectricstacked film 11 formed thereon improves, the reflecting abilities of thedielectric stacked film 11 can be improved by the difference in levels,and a semiconductor light emitting apparatus having high lightextraction efficiency can be provided.

The methods for manufacturing the semiconductor light emitting apparatusaccording to the first to fifth embodiments further include a processthat forms the connection member 14 on a mounting substrate, theconnection member 14 having a configuration in the plane parallel to thesurface of the mounting substrate smaller than a configuration of the atleast one of the n-side electrode 7 and the p-side electrode 4surrounded by the protruding portion 11 b. Thereby, the connectionmember 14 of the prescribed configuration can be formed, and thesemiconductor light emitting device and the mounting member 13 can beassembled with high precision. At this time, the height of theconnection member 14 is higher than the height of the protruding portion11 b.

FIG. 20 is a schematic cross-sectional view illustrating the structureof another semiconductor light emitting apparatus manufactured by themethod for manufacturing the semiconductor light emitting apparatusaccording to the embodiments of the invention.

A semiconductor light emitting apparatus 301 of this specific example isa white LED combining any of the semiconductor light emitting devicesaccording to the embodiments recited above and a fluorescent material.That is, the semiconductor light emitting apparatus 301 according tothis embodiment includes any of the semiconductor light emitting devicesrecited above and a fluorescent material layer irradiated by lightemitted by the semiconductor light emitting device.

The following description assumes the semiconductor light emittingdevice 101 recited above combined with a fluorescent material.

In the semiconductor light emitting apparatus 301 according to thisembodiment illustrated in FIG. 20, reflecting films 23 are provided oninner faces of a container 22 made of ceramic and the like. Thereflecting films 23 are provided separately on an inner side face and abottom face of the container 22. The reflecting film 23 is made of, forexample, aluminum and the like. The semiconductor light emitting device101 is disposed on the reflecting film 23 provided on the bottom portionof the container 22 via a submount 24. The submount 24 is the mountingmember 13.

As described above, the semiconductor light emitting device 101 and thesubmount 24 (the mounting member 13) are connected and fixed by theconnection members 14 (e.g., solder).

Bonding by a bonding agent, solder, etc., may be used to fix thesemiconductor light emitting device 101, the submount 24, and thereflecting film 23.

Patterned electrodes are formed on the surface of the submount 24 on thesemiconductor light emitting device side to insulate the p-sideelectrode 4 and the n-side electrode 7 of the semiconductor lightemitting device 101. Each of the electrodes is connected to anot-illustrated electrode provided on the container 22 by bonding wires26. The connection is made to the portion between the reflecting film 23of the inner side face and the reflecting film 23 of the bottom face.

A first fluorescent material layer 211 including a red fluorescentmaterial is provided to cover the semiconductor light emitting device101 and the bonding wire 26. A second fluorescent material layer 212including a blue, green, or yellow fluorescent material is formed on thefirst fluorescent material layer 211. A lid 27 made of silicon resin isprovided on the fluorescent material layer.

The first fluorescent material layer 211 includes a resin and the redfluorescent material dispersed in the resin.

The red fluorescent material may include, for example, an activatingsubstance of trivalent Eu (Eu³⁺) in a main material such as Y₂O₃, YVO₄,or Y₂(P, V)O₄. In other words, Y₂O₃:Eu³⁺, YVO₄:Eu³⁺, and the like may beused as the red fluorescent material. The molar concentration of Eu³⁺may be 1% to 10%. LaOS, Y₂(P, V)O₄, and the like may be used as the mainmaterial of the red fluorescent material in addition to Y₂O₃ and YVO₄.Mn⁴⁺ and the like may be used in addition to Eu³⁺. In particular,absorption at 380 nm increases by adding a small amount of Bi withtrivalent Eu to the YVO₄ base material. Therefore, the luminousefficiency increases even more. A silicon resin and the like, forexample, may be used as the resin.

The second fluorescent material layer 212 includes a resin and at leastone of a blue fluorescent material, a green fluorescent material, and ayellow fluorescent material dispersed in the resin. For example, afluorescent material combining a blue fluorescent material and a greenfluorescent material, a fluorescent material combining a bluefluorescent material and a yellow fluorescent material, or a fluorescentmaterial combining a blue fluorescent material, a green fluorescentmaterial, and a yellow fluorescent material may be used.

(Sr, Ca)₁₀(PO₄)₆Cl₂:Eu²⁺, BaMg₂Al₁₆O₂₇:Eu²⁺, and the like, for example,may be used as the blue fluorescent material.

Y₂SiO₅:Ce³⁺, Tb³⁺ having centers of light emission of trivalent Tb, forexample, may be used as the green fluorescent material. In such a case,energy is transmitted from Ce ions to Tb ions to improve the excitationefficiency. Sr₄Al₁₄O₂₅:Eu²⁺ and the like, for example, may be used asthe green fluorescent material.

Y₃Al₅:Ce³⁺ and the like, for example, may be used as the yellowfluorescent material.

A silicon resin and the like, for example, may be used as the resin.

In particular, trivalent Tb has a sharp light emission around 550 nm atwhich visibility is at a maximum and thereby markedly improves theluminous efficiency when combined with the sharp red light emission oftrivalent Eu.

According to the semiconductor light emitting apparatus 301 according tothis embodiment, ultraviolet light of 380 nm emitted by thesemiconductor light emitting device 101 is radiated to the substrate 10side of the semiconductor light emitting device 101 and efficientlyexcites the fluorescent materials recited above included in thefluorescent material layers by utilizing reflections of the reflectingfilms 23.

For example, the fluorescent material recited above having centers oflight emission of trivalent Eu and the like included in the firstfluorescent material layer 211 converts light into light having a narrowwavelength distribution around 620 nm to efficiently produce red visiblelight.

The blue, green, and yellow fluorescent materials included in the secondfluorescent material layer 212 are efficiently excited and efficientlyproduce blue, green, and yellow visible light.

Mixing such colors produces white light and light of other variouscolors with high efficiency and good color rendition.

The method for manufacturing the semiconductor light emitting apparatus301 according to this embodiment will now be described.

The methods described above may be used in the processes that fabricatethe semiconductor light emitting device 101. Therefore, the processesafter completion of the semiconductor light emitting device 101 will nowbe described.

First, a metal film forming the reflecting film 23 is formed on theinner face of the container 22 by, for example, sputtering. The metalfilm is patterned, and the reflecting film 23 is left on each of theinner side face and the bottom face of the container 22.

Then, the methods described in regard to the first embodiment are usedto fix the semiconductor light emitting device 101 on the submount 24(the mounting member 13). The submount 24 is disposed and fixed on thereflecting film 23 on the bottom face of the container 22. Bonding usinga bonding agent, solder, etc., may be used for the fixation.

Continuing, each of a not-illustrated n-side electrode and p-sideelectrode on the submount 24 is connected to a not-illustrated electrodeprovided on the container 22 by bonding wires 26.

The first fluorescent material layer 211 including the red fluorescentmaterial is then formed to cover the semiconductor light emitting device101 and the bonding wires 26. The second fluorescent material layer 212including the blue, the green, or the yellow fluorescent material isformed on the first fluorescent material layer 211.

The method for forming each of the fluorescent material layers may dropresin/source material mixture solutions having the fluorescent materialsdispersed therein and perform heat treatment to cure the resin bythermal polymerization. It is possible to cause the fine particles ofthe fluorescent materials to distribute unevenly in the lower layers ofthe first and second fluorescent material layers 211 and 212 toappropriately control the luminous efficacy of each of the fluorescentmaterials by allowing the resin/source material mixture solutionsincluding the fluorescent materials to lie for a while after droppingand prior to curing to allow the fine particles of the fluorescentmaterials to settle. Subsequently, the lid 27 is provided on thefluorescent material layer, and the semiconductor light emittingapparatus 301 according to this embodiment, that is, the white LED, isfabricated.

In the specification, “nitride semiconductor” includes all compositionsof semiconductors of the chemical formula B_(x)In_(y)Al_(z)Ga_(1-x-y-z)N(0≦x≦1, 0≦y≦1, 0≦z≦1, x+y+z≦1) for which each of the composition ratiosx, y, and z are changed within the ranges. “Nitride semiconductor”further includes group V elements other than N (nitrogen) in thechemical formula recited above and any of various dopants added tocontrol the conductivity type, etc.

Hereinabove, exemplary embodiments of the invention are described withreference to specific examples. However, the invention is not limited tothese specific examples. For example, one skilled in the art mayappropriately select configurations, sizes, material qualities,arrangements, etc., of components of semiconductor multi-layer films,metal films, dielectric films, etc., of semiconductor light emittingdevices or manufacturing methods from known art and similarly practicethe invention. Such practice is included in the scope of the inventionto the extent that similar effects thereto are obtained.

Further, any two or more components of the specific examples may becombined within the extent of technical feasibility; and are included inthe scope of the invention to the extent that the purport of theinvention is included.

Moreover, all methods for manufacturing semiconductor light emittingapparatuses and semiconductor light emitting apparatuses obtainable byan appropriate design modification by one skilled in the art based onmethods for manufacturing the semiconductor light emitting apparatusesand the semiconductor light emitting apparatuses described above asexemplary embodiments of the invention also are within the scope of theinvention to the extent that the purport of the invention is included.

Furthermore, various modifications and alterations within the spirit ofthe invention will be readily apparent to those skilled in the art. Allsuch modifications and alterations should therefore be seen as withinthe scope of the invention.

The invention claimed is:
 1. A method for manufacturing a semiconductorlight emitting apparatus, comprising: causing a semiconductor lightemitting device and a mounting member to face each other, thesemiconductor light emitting device including, a stacked structure unitincluding a first semiconductor layer, a second semiconductor layer, anda light emitting layer provided between the first semiconductor layerand the second semiconductor layer, a first electrode provided on amajor surface of the stacked structure unit to connect to the firstsemiconductor layer, a second electrode provided on the major surface ofthe stacked structure unit to connect to the second semiconductor layer,and a dielectric stacked film provided on the first semiconductor layerand the second semiconductor layer of the major surface not covered bythe first electrode and the second electrode, the dielectric stackedfilm being formed of stacked dielectric films having differentrefractive indexes, and including a protruding portion erected on atleast a portion of a rim of at least one of the first and secondelectrodes, the mounting member including a first connection member tobe connected to the first electrode and a second connection member to beconnected to the second electrode; stacking the first semiconductorlayer, the light emitting layer, and the second semiconductor layer on asubstrate; removing a portion of the second semiconductor layer and aportion of the light emitting layer to expose a first part and a secondpart of the first semiconductor layer; forming the first electrode onthe first part of the first semiconductor layer; forming the secondelectrode on the second semiconductor layer; and alternately stackingdielectric films having different refractive indexes on the firstsemiconductor layer and the second semiconductor layer not covered bythe first electrode and the second electrode to form the dielectricstacked film; between the exposing the first part and the second part ofthe first semiconductor layer and the forming the dielectric stackedfilm, forming a dielectric film having a better ability than thedielectric stacked film to cover the first semiconductor layer and thesecond semiconductor layer on the second part of the first semiconductorlayer and a part of the second semiconductor layer; and causing thefirst connection member to contact and join to the first electrode usingthe first protruding portion as a first guide and causing the secondconnection member to contact and join to the second electrode using thesecond protruding portion as a second guide.
 2. The method according toclaim 1, wherein the joining includes: bringing the semiconductor lightemitting device and the mounting member into contact in a substantiallyaligned state; and applying a vibration to at least one of thesemiconductor light emitting device and the mounting member in thecontacting state, inserting the connection member into a recesssurrounded by the protruding portion, and causing the connection memberto contact the at least one of the first and second electrodes.
 3. Themethod according to claim 2, wherein the joining further includeswelding the connection member to the at least one of the first andsecond electrodes after causing the inserted connection member tocontact the at least one of the first and second electrodes.
 4. Themethod according to claim 3, wherein the welding includes covering aportion of the protruding portion with the connection member.
 5. Themethod according to claim 1, wherein a height of the connection memberis higher than a height of the protruding portion.
 6. The methodaccording to claim 1, wherein a configuration of the connection memberin a plane parallel to the major surface is smaller than a configurationof a recess surrounded by the protruding portion in a plane parallel tothe major surface.
 7. The method according to claim 1, wherein theconnection member includes solder.
 8. The method according to claim 1,wherein the exposing the first part and the second part of the firstsemiconductor layer includes forming, on the stacked structure unit, atapered portion inclined with respect to a layer surface of the stackedstructure unit.
 9. The method according to claim 1, further comprising aforming the connection member on a mounting substrate, a configurationof the connection member in a plane parallel to a surface of themounting substrate being smaller than a configuration of the at leastone of the first and second electrodes surrounded by the protrudingportion.
 10. The method according to claim 1, wherein the dielectricstacked film reflects light emitted by the light emitting layer.
 11. Themethod according to claim 1, wherein the dielectric film having thebetter ability is formed by a chemical vapor deposition.
 12. The methodaccording to claim 1, wherein the dielectric stacked film is formed by avacuum vapor deposition.